Kelvin probe force microscopy work function characterization of transition metal oxide crystals under ongoing reduction and oxidation

• Dominik Wrana,
• Karol Cieślik,
• Wojciech Belza,
• Christian Rodenbücher,
• Krzysztof Szot and
• Franciszek Krok

Beilstein J. Nanotechnol. 2019, 10, 1596–1607, doi:10.3762/bjnano.10.155

• ) eV, which is almost 1 eV lower than previous X-ray photoemission electron microscopy (XPEEM) and UPS studies (4.13 and 4.2 eV) for untreated oxide [32][33]. As stated before, KPFM investigations reveal certain variations in the work function value of TiO nanostructures. To illustrate this properly a

Cathode lens spectromicroscopy: methodology and applications

• T. O. Menteş,
• G. Zamborlini,
• A. Sala and
• A. Locatelli

Beilstein J. Nanotechnol. 2014, 5, 1873–1886, doi:10.3762/bjnano.5.198

• microscopy (LEEM); magnetism; nanostructures; X-ray magnetic circular dichroism (XMCD); X-ray photoemission electron microscopy (XPEEM); Introduction The cathode lens, or immersion objective lens, is used to image electrons emitted from surfaces [1]. In a microscope that uses this type of objective, the